Advanced Micro-Characterization of Materials (AMCOM)

The program focus is materials characterization research using state of the art electron, X-Ray, and ion-optical techniques to characterize novel materials developed at AFRL/RX. The goal is to propose a solution to Air Force materials characterization needs as they arise and then proceed to develop and implement this solution, which shall include the utilization of existing tools, and the development and testing of/specialized software and/or hardware as required. This program encompasses materials characterization research and development activities on a broad range of material types. The objective is to perform research in material microstructural and compositional analyses on, but not limited to, metals, semiconductors, ceramics, polymers, composites, functionally graded materials, nanomaterials, electronic materials, sensor materials, and biological materials.

The contractor shall prepare authoritative reports, papers, presentations, technical data, and best practices guidance for the purposes of assisting the USAF and USSF to assess new optical technologies, performance characteristics thereof, and relative performance within proposed mission, installation, and cost.