X-Ray diffractometer
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General Information
- Contract Opportunity Type: Solicitation (Original)
- Original Published Date: Jan 30, 2025 03:20 pm PST
- Original Date Offers Due: Feb 07, 2025 01:00 pm PST
- Inactive Policy: Manual
- Original Inactive Date: Feb 08, 2025
- Initiative:
- None
Classification
- Original Set Aside: Total Small Business Set-Aside (FAR 19.5)
- Product Service Code: 6625 - ELECTRICAL AND ELECTRONIC PROPERTIES MEASURING AND TESTING INSTRUMENTS
- NAICS Code:
- 334517 - Irradiation Apparatus Manufacturing
- Place of Performance: Berkeley , CA 94720USA
Description
1 - X-RAY diffractometer. The system must meet the following minimum technical requirements and capabilities.
1) High brightness Cu x-ray source and solid-state 2D area detector. 5kW or brighter, sealed or rotating anode.
2) Automated or user interchangeable optics to enable the following X-ray measurement types:
• Reflected beam optics: Bragg-Brentano, Parallel beam, Convergent spot-focused beam <500um.
• Transmission beam optics: focusing optics for high resolution measurements.
3) Integrated sample mounting and software integration to enable the following:
• High-throughput sample stage for min. 96 well-plate. Software/hardware automation for alignment/measurement.
• Horizontal sample mount for both high-throughput stage and single sample that has the ability to measure in both reflection and transmission mode.
• Heating stage with integrated temperature control and measurement from room temperature to 1000C or greater. Must be compatible with vacuum, ambient, inert and reactive gasses, to include hydrogen gas.
• Detection and guidance features to ensure proper optical path accessories are installed for the type of measurement being performed.
• Must have automated beam alignment.
4) Software requirements:
• Software must have a user-friendly interface, and the ability to save measurement presets and set user/administrator settings as this tool will be available as a non-specialist, multi-user capability.
• Software must enable external scripting (such as Python) for automating hardware sample positioning and measurement controls.
• Must include a comprehensive suite of data analysis capabilities, including: Rietveld refinement, texture analysis, whole pattern fitting, peak-fitting, thin-film reflectivity pattern analysis, and data visualization.
Attachments/Links
Contact Information
Contracting Office Address
- 1 Cyclotron Rd
- Berkeley , CA 94720
- USA
Primary Point of Contact
- Anita Mathias
- amathias@lbl.gov
Secondary Point of Contact
History
- Feb 08, 2025 08:55 pm PSTSolicitation (Original)