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X-Ray diffractometer

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General Information

  • Contract Opportunity Type: Solicitation (Original)
  • Original Published Date: Jan 30, 2025 03:20 pm PST
  • Original Date Offers Due: Feb 07, 2025 01:00 pm PST
  • Inactive Policy: Manual
  • Original Inactive Date: Feb 08, 2025
  • Initiative:
    • None

Classification

  • Original Set Aside: Total Small Business Set-Aside (FAR 19.5)
  • Product Service Code: 6625 - ELECTRICAL AND ELECTRONIC PROPERTIES MEASURING AND TESTING INSTRUMENTS
  • NAICS Code:
    • 334517 - Irradiation Apparatus Manufacturing
  • Place of Performance:
    Berkeley , CA 94720
    USA

Description

1 - X-RAY diffractometer. The system must meet the following minimum technical requirements and capabilities.

1)  High brightness Cu x-ray source and solid-state 2D area detector. 5kW or brighter, sealed or rotating anode.

2)  Automated or user interchangeable optics to enable the following X-ray measurement types:

     •  Reflected beam optics: Bragg-Brentano, Parallel beam, Convergent spot-focused beam <500um.

     •  Transmission beam optics: focusing optics for high resolution measurements.

3)  Integrated sample mounting and software integration to enable the following:

     •  High-throughput sample stage for min. 96 well-plate. Software/hardware automation for alignment/measurement.

     •  Horizontal sample mount for both high-throughput stage and single sample that has the ability to measure in both reflection and transmission mode.

     •  Heating stage with integrated temperature control and measurement from room temperature to 1000C or greater. Must be compatible with vacuum, ambient, inert and reactive gasses, to include hydrogen gas.

     •  Detection and guidance features to ensure proper optical path accessories are installed for the type of measurement being performed.

     •  Must have automated beam alignment.

4)  Software requirements:

     •  Software must have a user-friendly interface, and the ability to save measurement presets and set user/administrator settings as this tool will be available as a non-specialist, multi-user capability.

     •  Software must enable external scripting (such as Python) for automating hardware sample positioning and measurement controls.

     •  Must include a comprehensive suite of data analysis capabilities, including: Rietveld refinement, texture analysis, whole pattern fitting, peak-fitting, thin-film reflectivity pattern analysis, and data visualization.

Contact Information

Contracting Office Address

  • 1 Cyclotron Rd
  • Berkeley , CA 94720
  • USA

Primary Point of Contact

Secondary Point of Contact





History

  • Feb 08, 2025 08:55 pm PSTSolicitation (Original)