Focused Ion Beam Scanning Electron Microscopes
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General Information
- Contract Opportunity Type: Combined Synopsis/Solicitation (Updated)
- Updated Published Date: Apr 24, 2023 02:55 pm EDT
- Original Published Date: Apr 10, 2023 03:05 pm EDT
- Updated Date Offers Due: May 16, 2023 10:00 am EDT
- Original Date Offers Due: May 16, 2023 10:00 am EDT
- Inactive Policy: 15 days after date offers due
- Updated Inactive Date: May 31, 2023
- Original Inactive Date: May 31, 2023
- Initiative:
- None
Classification
- Original Set Aside:
- Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
- NAICS Code:
- 334516 - Analytical Laboratory Instrument Manufacturing
- Place of Performance: Gaithersburg , MD 20899USA
Description
This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.
The solicitation number is NB100000-23-00586 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.
The NIST Center for Nanoscale Science and Technology (CNST) has a requirement for one (1) Gallium ion (Ga+) source focused ion beam scanning electron microscope (Ga+ FIB) system and one (1) Xenon (Xe) plasma source focused ion beam scanning electron microscope (Xe PFIB) to support nanofabrication research and development.
SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS. *Amendment 0001 updates the Statement of Work (Attachment 1) and provides answers to questions received (Attachment 2).
Attachments/Links
Contact Information
Contracting Office Address
- ACQUISITION MANAGEMENT DIVISION 100 BUREAU DR.
- GAITHERSBURG , MD 20899
- USA
Primary Point of Contact
- Ian Robinson
- ian.robinson@nist.gov
Secondary Point of Contact
- Don Collie
- donald.collie@nist.gov
History
- May 31, 2023 11:59 pm EDTCombined Synopsis/Solicitation (Updated)
- Apr 24, 2023 02:55 pm EDTCombined Synopsis/Solicitation (Updated)
- Apr 10, 2023 03:05 pm EDTCombined Synopsis/Solicitation (Original)
- Nov 28, 2022 11:56 pm ESTSources Sought (Original)